Hioki IM7587 Impedance Analyzer for High-Frequency Component Measurement up to 3 GHz

Posted by Billy 25/03/2026 0 Comment(s)

Hioki IM7587 Impedance Analyzer for High-Frequency Component Measurement up to 3 GHz

The Hioki IM7587 Impedance Analyzer is designed for engineers and manufacturers who need fast, stable, and repeatable impedance measurement at very high frequencies. Hioki positions the IM7587 as a 1 MHz to 3 GHz impedance analyzer with 0.5 ms test speed and 0.07% measured value variability, making it suitable for both R&D and high-volume production of components such as ferrite chip beads and chip inductors.

One of the IM7587’s biggest strengths is its combination of speed and frequency coverage. Hioki states that the analyzer supports a 1 MHz to 3 GHz source frequency range with 100 kHz setting resolution, while offering a fastest analog measurement time of 0.5 ms. This gives users the ability to evaluate high-frequency components efficiently without sacrificing throughput, which is especially important in production environments where both speed and repeatability matter.

The IM7587 is also built for stable, precise measurement in demanding applications. Hioki specifies ±0.65% reading basic accuracy and highlights 0.07% variability when measuring a 1 nH coil at 3 GHz. The instrument uses the RF I-V method, which supports high-frequency impedance analysis across a measurable range of 100 mΩ to 5 kΩ, with parameters including Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), and Q.

Another practical advantage is its production-focused functionality. Hioki includes a comparator function for PASS/FAIL judgment, contact check for verifying specimen connection, BIN measurement, memory functions, and equivalent circuit analysis. The company also notes that in Analyzer Mode, users can perform frequency sweeps, level sweeps, and time interval measurements, giving the IM7587 additional value beyond single-point impedance checks.

From a hardware standpoint, the IM7587 is designed to support flexible test setups. Hioki describes the system as having a half-rack size main unit with a palm-sized test head, helping users integrate it into lab and automated production environments more easily. The product page notes that the instrument ships with a test head and connection cable, while a dedicated test fixture or probe is required separately. Hioki also offers matching accessories such as the SMD Test Fixture IM9201, which supports six SMD sizes from 0201 to 1210, and the Test Fixture IM9202 for high-frequency testing up to 600 MHz.

For users who need external control and data integration, the IM7587 includes EXT I/O, USB communication, USB memory, and LAN as standard, with optional RS-232C and GP-IB interfaces. For engineering teams working on high-frequency passive component development, validation, and production testing, the Hioki IM7587 offers a strong combination of measurement range, test speed, and system integration flexibility.

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