As power electronics continue to move toward faster switching, higher efficiency, and more compact designs, engineers need current measurement tools that can keep up with real operating conditions. Fast transient events, long-duration waveform observation, and large-current behavior all matter when evaluating modern power conversion systems.
Hioki’s CT6704 and CT6705 current probes are designed for these demanding measurement environments. Built for high-frequency, large-current applications, they help engineers capture fast waveform changes while maintaining stable observation during extended tests.
Built for Fast, High-Current Measurements
In applications such as SiC and GaN inverters, DC/DC converters, motor drives, switching power supplies, and battery backup systems, current waveforms can change extremely quickly.
A measurement setup that misses transient behavior may also miss the root cause of switching noise, abnormal heating, control instability, or protection-circuit behavior.
The CT6704 and CT6705 help address this challenge by combining wide-bandwidth current measurement with practical usability for lab, validation, and troubleshooting work.
Key Benefits
Capture Fast Transient Events
High-speed switching devices require measurement tools that can show short-duration current behavior clearly. The CT6704 and CT6705 are intended for high-frequency measurement applications where transient visibility is critical.
This is especially useful when evaluating switching performance, current spikes, startup behavior, shutdown response, and protection events.
Stable Long-Duration Observation
Power electronics testing is not always a short bench measurement. Engineers often need to monitor waveforms over longer operating periods to confirm thermal behavior, load changes, operating stability, and abnormal events.
Low-drift performance helps support stable waveform observation during these longer tests, making it easier to compare results and document behavior over time.
Reduced Inductive Heating
Current probes used in large-current environments can be affected by heating during extended measurement. The CT6704 and CT6705 are designed with reduced inductive heating, helping support more reliable measurements during demanding test conditions.
This matters when engineers need repeatable results during validation, endurance testing, or high-load operation.
Easy Integration with BNC Output
With BNC output, the probes can be integrated into common oscilloscope and waveform analysis setups. This makes them practical for engineering teams already using high-speed measurement platforms in R&D, product validation, and troubleshooting.
Ideal Applications
The Hioki CT6704 and CT6705 are well suited for engineers working on:
- SiC and GaN inverters
- DC/DC converters
- Motor drives
- Switching power supplies
- Battery backup systems
- Power conversion validation
- Transient current analysis
- Long-duration waveform monitoring
- R&D and troubleshooting for high-speed power electronics
Why This Matters
Modern power electronics are becoming faster and denser. That creates new measurement challenges: higher switching frequencies, sharper current transitions, increased thermal sensitivity, and more complex operating modes.
A current probe must do more than simply measure current. It must preserve waveform detail and remain stable throughout the test.
For engineers working on next-generation power conversion systems, the Hioki CT6704 and CT6705 provide a practical path to clearer, more reliable current waveform observation.
RCCE Can Help
RCCE supports Canadian engineers, maintenance teams, and test labs with Hioki measurement solutions for power electronics, electrical testing, and data acquisition.
If your team is evaluating current probes for high-frequency or large-current applications, contact RCCE to discuss whether the Hioki CT6704 or CT6705 is the right fit for your measurement setup.
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