| Main functions | DC hipot test, Insulation resistance test, Breakdown voltage (BDV) test, Waveform display function, Arc detection, Contact check function |
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| Operating temperature and humidity range | 0°C to 40°C (32°F to 104°F), 80% RH or less (non-condensing) |
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| Standards | Safety: IEC 61010; EMC: EN 61326 |
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| Power supply | 100 V to 240 V AC, 50 Hz/60 Hz |
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| Power consumption | Approx. 180 VA; (220 V, DC hipot test mode, 2.5 kV, 5 mA load current) |
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| Maximum rated power | 800 VA |
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| Interface | USB, LAN, EXT. I/O; Optional: RS-232C (Z3001), GP-IB (Z3000); Memory: USB drive |
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| Dimensions and mass | Approx. 305 mm (12.01 in.) W × 142 mm (5.59 in.) H × 430 mm (16.93 in.) D (excluding protrusions); Approx. 10.4 kg (366.8 oz.) |
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| DC hipot test | • Output voltage: 0.010 kV DC to 8.000 kV (1 V resolution); • Output setting accuracy: ±20 V (below 3 kV, no load), ±0.4 % of setting ±8 V (3 kV and above, no load); • Output/cutoff current: Max. 20 mA (test voltage 50 V or higher); • Current accuracy: ±1.5% rdg. (typ., see instruction manual or brochure for details); • Minimum resolution: 0.001 µA; • Test time: 0.1 s to 999 s, continuous (timer OFF); • Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, OFF; • Test modes: W to IR, IR to W, Program test |
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| Insulation resistance test | • Output voltage: 10 V DC to 2000 V (1 V resolution); • Output setting accuracy: ±20 V (no load); • Resistance display range: 100.0 kΩ to 200.0 GΩ (0.01 kΩ resolution); • Accuracy guarantee range: 100.0 kΩ to 99.99 GΩ; • Resistance accuracy: ±1.5% rdg. (see instruction manual or brochure for detailed range‑wise accuracy); • Test time: 0.1 s to 999 s, continuous (timer OFF); • Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, OFF |
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| Breakdown voltage (BDV) test | • Test methods: Continuous voltage rise test, Stepped voltage rise test; • Measurement: Insulation breakdown voltage (kV), Insulation breakdown strength (kV/mm); • Settings: Start voltage, End voltage, Rise speed, Arc detection, Electrode distance, Upper limit current |
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| Waveform display function | • Waveforms: Voltage, Current, Insulation resistance; • Sampling rate: Max. 500 kS/s; • Display length: 0.5 s to 128 s (9 steps); • Memory capacity: 512 k words |
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| Arc detection | • Detection method: Monitoring of test‑voltage fluctuations; • Setting range: Test‑voltage variability 1% to 50% |
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| Contact check function | • Detection method: Capacitance‑measurement method; • Setting range: Threshold (capacitance) setting 1.0 nF to 100.0 nF |
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| Memory functions | • Waveform / graph save:; Destination: USB memory; Formats: BMP, PNG, CSV; ; • Panel memory:; DC hipot/IR: up to 64 sets each; BDV test: up to 10 sets; Program test: up to 30 programs (max. 50 steps); ; • Data memory:; Up to 32,000 measured values |
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| Judgment functions | • PASS, FAIL (UPPER FAIL, LOWER FAIL); • Judgment output via EXT. I/O and communication |
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| Safety and usability functions | • Interlock: links output enable/disable with external safety devices; • Automatic discharge: internal discharge after testing (residual voltage 30 V or less); • Voltage limitation:upper‑limit control from 0.010 kV to 8.000 kV; • Auto range: automatic range switching based on measured values; • Panel memories: store and recall test conditions; • Self‑check/Key lock/Command monitor/I/O HANDLER test |
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