3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact

3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact supports electrical safety and withstand testing.

HIOKI 3504-60 C HiTESTER is a dual-frequency capacitance meter designed for high-speed inspection of large-capacitance multilayer ceramic capacitors (MLCCs) on taping machines and automated production lines.

It measures capacitance (C) and dissipation factor (D/tan δ) at 120 Hz or 1 kHz with a typical 2 ms measurement time. Constant-voltage testing supports capacitance measurements where voltage dependency matters, while the 3504-60 four-terminal contact check detects contact failures on all measurement terminals for improved inspection reliability.

Key Features

• C measurement range from 0.9400 pF to 20.0000 mF; D range from 0.00001 to 1.99999
• 120 Hz and 1 kHz measurement frequencies with 100 mV, 500 mV and 1 V RMS signal levels
• Typical 2 ms measurement time for fast production testing
• Four-terminal contact check exclusive to the 3504-60
• BIN sorting, comparator, averaging, low-C reject and chatter detection functions
• GP-IB, RS-232C and EXT I/O for automated system integration

Measurement probes and test fixtures are not included and must be selected and purchased separately.

Need help selecting the right HIOKI configuration? Contact RCC Electronics for Canadian application support and a quotation.