3504-50 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning

3504-50 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning supports HIOKI measurement-system support.

The HIOKI 3504-50 C HiTESTER is a high-speed, dual-frequency capacitance meter designed for large-capacitance multilayer ceramic capacitor (MLCC) inspection. Constant-voltage measurement supports components with voltage-dependent capacitance, while BIN classification and external interfaces make the instrument suitable for automated sorting and production lines.

• Measures capacitance (C) and dissipation factor (D/tan δ)
• Selectable 120 Hz and 1 kHz measurement frequencies
• 500 mV and 1 V rms measurement signal levels
• High-speed measurement: 2 ms typical, depending on configuration
• BIN classification, comparator, averaging and contact-error monitoring
• GP-IB, RS-232C and EXT. I/O for automated systems
• Measurement range: C from 0.9400 pF to 20.0000 mF; D from 0.00001 to 1.99999

Note: Measurement probes and test fixtures are sold separately.

Need help selecting the right HIOKI configuration? Contact RCC Electronics for Canadian application support and a quotation.