3506-10 - HIOKI C Hi-Tester (1kHz and 1MHz) Low Noise

3506-10 - HIOKI C Hi-Tester (1kHz and 1MHz) Low Noise

Official HIOKI product information for 3506-10 - HIOKI C Hi-Tester (1kHz and 1MHz) Low Noise.

Key Capabilities

• High-speed analog test time of 0.6 ms (at 1 MHz)
• Improved noise resistance and enhanced repeatability in measurement precision even for production lines
• 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
• BIN function, for easy component screening

Contact RCC Electronics for Canadian availability, configuration guidance and a formal quotation.

Technical Specifications

Official HIOKI product information

Standard Accessories

• Power cord × 1, Instruction manual × 1, Spare fuse × 1

Optional accessories below are not included unless stated on the RCCE quotation.

Optional Accessories

• SMD TEST FIXTURE IM9100 — • Direct-connection testing; • Test SMDs with electrodes on the bottom; • DC to 8MHz（Can be measured up to 10 MHz, when combined with the special order model IM3536-01）; • Measurable sample sizes: Metric (Inch): 0402 (01005), 0603 (0201), 1005 (0402)
• SMD TEST FIXTURE IM9110 — • For direct connection two-wire testing; • DC to 1 MHz; • Measurable sample size: 008004 (inch)
• CONTACT TIPS IM9901
• CONTACT TIPS IM9902
• 4-TERMINAL PROBE L2000
• PINCHER PROBE L2001 — • DC to 8MHz, 50Ω termination; • Tip electrode spacing: 0.3 to 6 mm ; • Measurable sample sizes: 0201 to 2220 (inch)
• 4-TERMINAL PROBE 9140-10
• TEST FIXTURE 9261-10
• TEST FIXTURE 9262
• SMD TEST FIXTURE 9263
• 4-TERMINAL PROBE 9500-10
• SMD TEST FIXTURE 9677
• SMD TEST FIXTURE 9699
• GP-IB CONNECTOR CABLE 9151-02
• RECORDING PAPER 1196
• CONNECTION CABLE 9444

Confirm compatibility and the final configuration with RCC Electronics before ordering.