3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact

Name: 3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact
Brand: HIOKI
SKU: 3504-60
Price: 7810.60 CAD
Availability: OutOfStock

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Brand: HIOKI
Product Code: 3504-60
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CAD 7,810.60

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Description

3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact

Official HIOKI product information for 3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact.

Key Capabilities

High speed measurement of 2ms
Supports C measurements with voltage dependency characteristics through the use of constant voltage testing (CV)
Model 3504-60 can detect contact failure on all 4 terminals for increased reliability
BIN function on the 3504-60/-50 is ideal for sorting machines
Model 3504-40 offers high speed and affordability, perfect for integrating into taping machines
In all models, contact error is constantly monitored during measurement, contributing to increased yield

Contact RCC Electronics for Canadian availability, configuration guidance and a formal quotation.

Technical Specifications

Measurement parameters	C (capacitance), D (loss coefficient tan δ)
Measurement range	C: 0.9400 pF to 20.0000 mF, D: 0.00001 to 1.99999
Basic accuracy	(Typ.) C: ±0.09 % rdg. ±10 dgt., D: ±0.0016
Measurement frequency	120 Hz, 1 kHz
Measurement signal level	100 mV (3504-60 only), 500 mV, 1 V rms; CV 100 mV Measurement range: up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz); CV 500 mV Measurement range : up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz); CV 1V Measurement range : up to 70 μF range (Source frequency 1 kHz), up to 700 μF range (Source frequency 120 Hz)
Output impedance	5Ω (In open terminal voltage mode outside of the CV measurement range)
Display	LED (six digits, full scale count depends on measurement range)
Measurement time	2 ms (Typ. value. Depends on measurement configuration settings)
Functions	4-terminal contact check function (3504-60 only); BIN (measurement values can be classified by rank) (3504-50, 3504-60), Trigger-synchronous output, Setting configurations can be stored, Comparator, Averaging, Low-C reject (bad contact detection), Chatter detection, EXT. I/O, RS-232C, GP-IB (3504-50, 3504-60)
Power supply	Selectable from 100, 120, 220 or 240 V AC ±10 %, 50/60 Hz, 110 VA max.
Dimensions and mass	260 mm (10.24 in) W × 100 mm (3.94 in) H × 220 mm (8.66 in) D, 3.8 kg(134.0 oz)

Official HIOKI product information

Tags: HIOKI, 3504-60, Safety Testing, electrical test equipment

3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact

3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact

Key Capabilities

Technical Specifications

Standard Accessories

Optional Accessories