3504-60 - HIOKI C Hi-Tester (120 Hz and 1kHz) with GP-IB, Binning, Contact

HIOKI 3504-60 C HiTESTER is a dual-frequency capacitance meter designed for high-speed inspection of large-capacitance multilayer ceramic capacitors (MLCCs) on taping machines and automated production lines.

It measures capacitance (C) and dissipation factor (D/tan δ) at 120 Hz or 1 kHz with a typical 2 ms measurement time. Constant-voltage testing supports capacitance measurements where voltage dependency matters, while the 3504-60 four-terminal contact check detects contact failures on all measurement terminals for improved inspection reliability.

Key Features

• C measurement range from 0.9400 pF to 20.0000 mF; D range from 0.00001 to 1.99999
• 120 Hz and 1 kHz measurement frequencies with 100 mV, 500 mV and 1 V RMS signal levels
• Typical 2 ms measurement time for fast production testing
• Four-terminal contact check exclusive to the 3504-60
• BIN sorting, comparator, averaging, low-C reject and chatter detection functions
• GP-IB, RS-232C and EXT I/O for automated system integration

Measurement probes and test fixtures are not included and must be selected and purchased separately.